光計測用光学機器と光計測システムのシナジーオプトシステムズ

PRODUCT OVERVIEW
SOPHISTICATED OPTICAL BEAM NFP MEASUREMENT OPTICS M-Scope type S

M-Scope type S

M-Scope type S is a high performance optical system for NFP/optical beam profile measurement of laser diodes, optical fibers, optical waveguides, and various light emitting devices and modules. This is a high-performance optical system that is ideal for laser beam profiler in the 400~1700nm spectral range.

Equipped with manual revolver for objective lens, you can easily select the most appropriate magnification. Additionally, with optional coaxial epi-illumination system for image observation, you can observe microscopic image such as fiber end face, waveguide end face, LD chip surface, outline appearance of lens module and so on.

With these sophisticated functionalities of M-Scope type S, it will be applicable from optical beam profile measurement to assembling adjustment of various optical modules. In combination with Optical Beam Analysis Module AP013 and various imaging detectors, it will be applicable for high-functional laser beam profiler and optical beam profile measurement in 400~1700nm spectral range. In addition, it will be also applicable to the encircled flux measurement and analysis. This function will be indispensable to understand optical characteristic of G.I. multimode fibers.

FEATURE

  • Equipping 4 hole manual revolver to switch multiple objective lens
  • Maximum 200 optical magnifications for evaluating minute spot.
    • Using optional 2x intermediate  lens port MS-OP011-RL2 and 100× objective lens
  • In combination with optional coaxial epi-illumination system, it will be possible to observe real microscopic image observation and positioning.
  • By selecting imaging detector, it will be applicable for optical beam profile observation and analysis from 400~1700nm wavelength range
  • In combination with SYNOS' Optical Beam Analysis Module AP013, it will be applicable to various optical beam profile analysis application including EF (encircled flux) analysis.

APPLICATION

  • High functional laser beam profiler of various laser devices and modules.
  • Optical beam NFP/beam profile observation and analysis of various optical devices and modules.
    • Laser diodes, laser devices, optical fibers, optical waveguides, and various optical devices and modules
  • R&D, evaluation of Si photonics devices
  • R&D, evaluation of polymer waveguides for OPCB application
  • Encircled flux analysis of GI MMF
  • General purpose optical beam monitors and beam profile applications from visible - NIR wavelength range

SUMMARY OF SPECIFICATION

SUMMERY OF SPECIFICATION

Objective lens switching Manual revolver (mounting maximum 4 objective lenses)
Objective lens Mitsutoyo M-Plan Apo series (standard)
Intermediate lens 1×(standard), 2×,1/2×(option)
Total magnification standard:100×(with a 100× objective lens)
option:200× (Using an optional 2× intermediate magnification lens and an objective lens with 100×)
Coaxial epi-illumination port option: coaxial epi-illumination port (for tip diameter φ8mm port light unit), coaxial epi-illumination system
Extinction method by Neutral Density Filter
Camera mount C mount

(REFERENCE)MEASUREMENT VIEW AND PIXEL RESOLUTION (APPROX. VALUE) IN COMBINATION WITH MAIN DETECTORS AND OBJECTIVE LENSES

Imaging detector High Resolution CMOS Detector ISA071/ISA071GL InGaAs Hi-sensitivity NIR Detector ISA041H2
Wavelength range 400~1100nm 950~1700nm
Sensor Format / Active imager size 1/1.8 inch approx. 6.4mm×5.12mm
Number of effective pixels 2048×1536 pixels 320×256 pixels
objective lens Intermediate lens Total magnification View(approx.) Pixel Resolution
(approx.) *1
View(approx.) Pixel Resolution
(approx.) *1
10× 10× 700μm×520μm 0.345um 640um×512um 2um
20× 20× 350um×260um 0.173um 320um×256um 1um
50× 50× 140um×100um 0.069um 128um×102.4um 0.4um
100× 100× 70um×50um 0.035um 64um×51.2um 0.2um
(Option) With 2× intermediate lens port
10× 20× 350um×260um 0.173um 320um×256um 1um
20× 40× 175um×130um 0.087um 160um×128um 0.5um
50× 100× 70um×50um 0.035um 64um×51.2um 0.2um
100× 200× 35um×25m 0.0175um 32um×25.6um 0.1um

*1 Pixel Resolution:calculated value by (View)/(Number of effective pixels), means length equivalent to 1pixel of image sensor.

SIMPLE STRUCTURE OF SOPHISTICATED NFP MEASUREMENT OPTICS M-Scope type S

The measurement light emitted from the sample is magnified by the first-stage objective lens and imaged on the image detector at the latter stage of the optical system by the imaging lens. The captured images are processed on a PC and analyzed for the emission beam profile, beam width, power distribution, etc. of the sample.

COMPONENT

STANDARD COMPONENT

  • Optics main unit (optics main unit, 4 holes manual revolver, filter port) : 1set
  • Base plate for optics : 1set

OPTION

  • Intermediate lens port
    • 2× Intermediate Lens Port MS-OP011-RL2
      • Intermediate lens unit that doubles the overall magnification of the optical system. (up to 200× with 100× objective lens)
    • 1/2× Intermediate Lens Port MS-OP011-RLH
      • Intermediate lens unit that halves the overall magnification of the optical system.
  • Coaxial Epi-illumination Port MS-OP011-CEP
    • Coaxial epi-illumination port with removable half mirror.
  • Objective lens selection
    • About objective lens selection, please refer to here.
  • Imaging detector selection
  • Neutral density filter
    • About neutral density filter, please refer to here.
  • Coaxial epi-illumination system
    • About coaxial epi-illumination system, please refer to here.
  • Optics base and workbench
    • Optics base unit for optical fiber measurement
    • Vertical workbench for optics
    • About optics base and workbench, please refer to here.

OUTSIDE DIMENSIONS

OUTSIDE DIMENSIONS <M-Scope type S>

Outside dimensions above is reference values. These values change as equipped option and detector. Please ask the drawing data in details if necessary.

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