HIGH-PERFORMANCE OPTICAL MEASUREMENT EQUIPMENT AND SYSTEM SOLUTION

OPTICS AND OPTICAL MEASUREMENT INSTRUMENTS

SIMPLIFIED OPTICAL BEAM NFP MEASUREMENT OPTICS　M-Scope type L

PRODUCT OVERVIEW

mscopetypel

M-Scope type L is a simple functionality and less expensive NFP measurement optics without manual revolver and LED coaxial epi-illumination port.

Various types of imaging detectors and objective lenses are available. It is suited for built-in use for various equipment due to its small size body.

It is possible to construct the laser beam profiler and NFP measurement system at low cost by combining with various imaging detectors and Synos' Optical Beam Analysis Module AP013. Additionally, it is also possible to apply to encircled flux analysis of GI type multimode optical fibers.

FEATURE

  • Simple functionality and cost effective model without manual revolver and coaxial epi-illumination port.
  • By selecting the imaging detector, it will be applicable for beam profile measurement and analysis in 400~1700nm wavelength range.
  • In combination with SYNOS' Optical Beam Analysis Module AP013, it will be applicable to laser beam profiler and NFP measurement including EF (Encircled Flux) measurement.
  • It is suited for built-in use for various equipment because of small size body.

APPLICATION

  • Laser beam profiler of various laser devices and modules.
  • Optical beam NFP/beam profile observation and analysis of various optical device and module.
    • Laser diodes, laser devices, optical fibers, optical waveguides, and various optical devices and modules
  • R&D, evaluation of Si photonics devices
  • R&D, evaluation of polymer waveguides for OPCB application
  • Encircled flux analysis of GI MMF
  • General purpose optical beam monitors and beam profile applications from visible - NIR wavelength range

SUMMARY OF SPECIFICATION

MAIN SPECIFICATION OF THE OPTICS
Objective lens switching Re-mounting objective lens (without manual revolver)
Objective lens Mitutoyo M-Plan Apo series (standard)
Intermediate lens 1× (fixed)
Maximum optical magnification 100×（with 100× objective lens）
Coaxial epi-illumination Not available
Optical attenuation method By neutral density filters
Camera mount C mount
【REFERENCE DATA】MEASUREMENT VIEW AND PIXEL RESOLUTION (CALCULATED AMOUNT) IN COMBINATION WITH MAIN SENSORS AND OBJECTIVE LENSES
【DETECTOR SELECTION】CMOS Detector ISA071/ISA071GL, InGaAs NIR Detector ISA041H2
Imaging detector High Resolution CMOS Detector
ISA071, ISA071GL		 InGaAs High Sensitivity NIR Detector
ISA041H2
Wavelength range 400-1100nm 950-1700nm
Sensor Format 1/1.8" approx. 6.4ｍｍ x 5.12mm
Effective pixels number 2048×1536 pixels 320×256 pixels
Objective lens Intermediate lens Total magnification Measurement view Pixel resolution*1 MMeasurement view Pixel resolution*1
10× 1× 10× 700μmx520μm 0.345um 640umx512um 2um
20× 1× 20× 350umx260um 0.173um 320umx256um 1um
50× 1× 50× 140umx100um 0.069um 128umx102.4um 0.4um
100× 1× 100× 70umx50um 0.035um 64umx51.2um 0.2um
【Detector Selection】InGaAs High Resolution NIR Detector ISA041HRA（SXGA）/ISA041HRVA（VGA）
Imaging Detector InGaAs High Resolution NIR Detector
ISA041HRA (SXGA type)		 InGaAs High Resolution NIR Detector
ISA041HRVA (VGA type)
Spectral range 400-1700nm 400-1700nm
Effective pixels number 1280×1024 pixels 640×512 pixels
Pixel pitch 5μm 5μm
Sensor format 6.4mm×5.12mm（1/2"） 3.2mm×2.56mm（1/4"）
Objective lens Intermediate lens Total magnification Measurement view Pixel resolution*1 Measurement view Pixel resolution*1
10× 1× 10× 640μm×512μm 0.5um 320umx256um 0.5μm
20× 1× 20× 320um×256um 0.25um 160um×128um 0.25um
50× 1× 50× 128um×102.4um 0.1um 64um×51.2um 0.1um
100× 1× 100× 64um×51.2um 0.05um 32um×25.6um 0.05um
  • *1 Pixel Resolution：Calculated value by (View)/(effective pixels number), means length equivalent to 1 pixel of image sensor.
  • These values shown above are approximate values calculated from image sensor size and sensor pitch.

COMPONENT

STANDARD COMPONENT
  • M-Scope type L (optics unit) : 1set
  • Base plate for optics : 1set
OPTION

OUTSIDE DIMENSIONS

OUTSIDE DIMENSIONS OF M-Scope type L
  • Outside dimensions above is reference values. These values change as equipped option and detector. Please ask the drawing data in details if necessary.

RELATED PRODUCTS INFORMATION

SYSTEM SOLUTION / DATA PROCESSING AND ANALYSIS SYSTEM
  • Optical Beam NFP Measurement System
    • NFP measurement and analysis system in combination with Simplified NFP Measurement Optics M-Scope type L and Optical Beam Analysis Module AP013. It is possible to build cost effective laser beam profiler system.
  • Encircle Flux Measurement System
    • EF measurement system for MMF by optics and image processing method.
  • Optical Beam Analysis Module AP013
    • Data acquisition and analysis system for optical beam analysis. AP013 is composed of a personal computer for data acquisition and data analysis, SYNOS' Optical Beam Analysis Software Optometrics BA Standard, camera driver software, and calibration data set.
OTHER OPTICS FOR OPTICAL MEASUREMENT

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