HIGH-PERFORMANCE OPTICAL MEASUREMENT EQUIPMENT AND SYSTEM SOLUTION

OPTICAL MEASUREMENT SYSTEM SOLUTION

OPTICAL BEAM NFP MEASUREMENT SYSTEM

PRODUCT OVERVIEW
OPTICAL BEAM NFP MEASUREMENT SYSTEM

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Optical Beam NFP (Near Field Pattern) Measurement System is general-purpose beam profiler system, widely applicable from optical beam observation to highly advanced optical beam analysis.

Synos’ M-Scope type S, Sophisticated NFP Measurement Optics, is adopted as NFP measurement optics in this system. In combination with M-Scope type S, imaging detector and Synos' Optical Beam Analysis Module AP013, it is widely applicable for NFP & optical beam observation, measurement and analysis of various optical devices, modules, components.

By selecting imaging detector, it will be possible to build up high performance laser beam profiler, NFP (optical beam profile) measurement system in 400~1700nm spectral range.

FEATURE

  • Synos’ M-Scope type S, Sophisticated NFP Measurement Optics, is adopted as NFP measurement optics
    • Equipping manual revolver to switch multiple objective lens
    • Optional coaxial epi-illumination system for image observation
    • Possible to choose M-Scope type L, low cost type NFP optics
  • Possible to select suitable imaging detector from 400~1700nm spectral range
    • for 400~1100nm : High Resolution CMOS Detector ISA071/ISA071GL
    • for 950nm~1700nm : InGaAs High Sensitivity NIR Detector ISA041H2
    • 【NEW】for 400nm~1700nm : InGaAs High Resolution NIR Detector ISA041HRA/ISA041HRVA
  • Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
    • All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
    • Optometrics BA Standard, specially designed high-functional image processing software for optical beam profile analysis
      • Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
      • EF/EAF analysis function is installed as standard function.

APPLICATION

  • Image processing method high functional laser beam profiler in 400~1700nm spectral range.
  • Optical beam NFP/beam profile observation and analysis of various optical device and module.
    • Laser diode, laser device, optical fiber, optical waveguide, and various optical device and module
  • NFP measurement, optical beam pattern analysis of various waveguide modules such as polymer waveguide module, Si photonics device and so on.
  • NFP measurement of polymer waveguide for OPCB application
  • R&D, evaluation of Si photonics device
  • Encircled flux analysis of various MMF device
  • Optical beam observation and beam profile measurement application in visible~NIR spectral range in general

SYSTEM COMPONENT SELECTION

SYSTEM CONFIGURATION DIAGRAM
COMPONENT SELECTION
  • NFP measurement optics selection
    • Sophisticated NFP Measurement Optics M-Scope type S
      • Manual revolver (standard equipment), coaxial epi-illumination connect port (optional)
    • Simplified NFP Measurement Optics M-Scope type L
      • Monocular (without manual revolver), coaxial epi-illumination is not available
  • Detector selection
    • 400~1100nm: High Resolution CMOS Detector ISA071/ISA071GL
    • 950~1700nm: InGaAs High Sensitivity NIR Detector ISA041H2
    • 400~1700nm: 【NEW】InGaAs High Resolution NIR Detector ISA041HRA/ISA041HRVA
      • About optical sensor selection, please refer to here.
  • Optical Beam Analysis Module AP013
    • Personal Computer for data processing
    • Optical beam analysis software Optometrics BA Standard
    • Calibration data set for NFP measurement
    • Driver software for imaging detector
  • Accessories
    • Cables
    • Documents (instruction manuals, etc.)
OPTIONAL UNITS・ACCESSORIES SELECTION
  • Option for M-Scope type S
    • 2× Intermediate Lens Port MS-OP011-RL2
      • Intermediate lens unit that doubles the overall magnification of the optical system. (up to 200× with 100× objective lens)
    • 1/2× Intermediate Lens Port MS-OP011-RLH
      • Intermediate lens unit that halves the overall magnification of the optical system.
    • Coaxial Epi-illumination Port MS-OP011-CEP
      • Coaxial epi-illumination port with removable half mirror.
    • About optional units for M-Scope type S in details, please refer to here.
  • Objective lens selection
    • About objective lens selection, please refer to here.
  • ND filter
    • for visible(400~700nm):NDF-5
    • for NIR(700nm~1100nm):NDF NIR-5
    • for IR(1310nm~1550nm):NDF IR-5
      • About ND filter, please refer to here.
  • Coaxial epi-illumination system
    • About coaxial epi-illumination system, refer to here.
  • Optics base and workbench
    • Optics bench for optical fiber measurement
    • Vertical type optics bench
      • About optics base and workbench, please refer to here.

RELATED PRODUCT INFORMATION

  • FFP Measurement System
    • FFP measurement system by dedicated optics and image processing method
  • Collimated Beam Measurement System
    • System that observes and measures the narrow divergence angle of a light beam (collimated light condition) with high resolution and in real time.
  • NFP/FFP simultaneous measurement system
    • System that simultaneously measures NFP and FFP of a light beam with a single optical system.
  • Encircled Flux Measurement System
    • System that measures and analyzes Encircled Flux of GI-MMF.
  • Optical Beam Analysis Module AP013
    • All-in-one package high functional optical beam profile analysis system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, detector driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
  • In addition, we have a variety of optical measurement units and systems for various purposes and applications.

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