OPTICAL MEASUREMENT SYSTEM SOLUTION

OPTICAL MEASUREMENT SYSTEM PRODUCTS / HEADLINE

We introduce our optical measurement inspection system product line-up that combines our optical measurement optical system with software, image processing, precision positioning stage, optical measurement instrument, etc.

Optical device and optical component are widely embedded and applied for various electronics products as prevailing technology. First, We propose various optical measurement system for evaluating optical characteristic of various optical device such as light emitting device, light receiving device, optical fiber, waveguide module and other optical device.

Furthermore, as a new product group, optical beam profile measurement system for high power lasers with ~10 W output class, which is in high demand in the fields of automotive optoelectronics, laser lighting, biometrics, electronics, and medical application etc., has been added.

In addition, we can offer a variety of custom-made system that utilize our optical measurement optics, precision positioning stages, and image processing technology.

OPTICAL MEASUREMENT SYSTEM PRODUCTS / NEWS&TOPICS

【NEW】 2022/3/1	【NEW PRODUCT】Extra Wide Area FFP Measurement System We have released Extra Wide Area FFP Measurement System that supports the measurement of large area light emitting devices. Extra Wide Area FFP Measurement Optics M-Scope type FSW, having approx, 4.24mm luminus flux diameter, is adopted. Realtime FFP measurement is realized.	Extra Wide Area FFP Measurement System
2020/7/1	Photometric Module (IVL Measurement Module/Polarization Measurement Module) We launched IVL Measurement Module PMD002/IVL, Polarization Measurement Module PMD002/POL, as the new product lineups of Photometric Module. These products are intended to apply for measurement and evaluation of various light emitting devices such as VCSEL.	PMD002/IVL PMD002/POL
2020/7/1	Wafer Level Optical Characteristic Measurement System For VCSEL This system is for wafer level optical characteristic measurement of VCSEL. Various parameters such as IVL, NFP, FFP, spectrum, polarization, etc. of VCSEL can be measured and evaluated under wafer level.	Wafer Level Optical Characteristic Measurement System For VCSEL
2019/4/1	3 types of optical beam measurement system for high power laser We launched Sophisticated NFP Measurement System For High Power Laser, FFP Measurement System For High Power Laser, and NFP/FFP Simultaneous Measurement System For Blue High Power Laser. These products are intended to accurately and rapidly measure the optical characteristics of output ~10W class high power lasers that are in widespread demand for automotive applications, lighting applications, and electronics applications, etc.
2019/4/1	Wide Area Type FFP Measurement System We released Wide Area Type FFP Measurement System that uses our Wide Area Type FFP Measurement Optics M-Scope type FW with measuring beam diameter coverage of φ3 mm. Accurate and fast FFP measurement for large area light emitting devices and large core optical fibers can be performed.	Wide Area Type FFP Measurement System
STANDARD	【INTERNATIONAL STANDARDIZATION】 EF/EAF MEASUREMENT METHOD ＊Encircled Flux measurement method : IEC61280-1-4 ＊Enciecled Angular Flux measurement method : IEC61330-3-53	EF/EAF Measurement System

OPTICAL MEASUREMENT SYSTEM PRODUCTS / LINEUP AND PRODUCT OUTLINE

LASER BEAM PROFILER AND GENERAL-PURPOSE OPTICAL BEAM MEASUREMENT SYSTEM

OPTICAL BEAM NFP(Near Field Pattern) MEASUREMENT SYSTEM	High functional and general purpose laser beam profiler and NFP/optical beam profile measurement system. Best for beam profile measurement and analysis of various laser devices, optical devices, optical modules and optical components.	NFP/beam profile observation and analysis of LDs, fibers, waveguides and various optical devices Evaluation, assembling adjustment of various optical module
FFP(Far Field Pattern) MEASUREMENT SYSTEM	FFP/N.A. measurement system by dedicated optics and image processing method. Best for FFP/N.A. evaluation of various optical devices, optical fibers, optical modules, etc.	FFP (Far Field Pattern) measurement of laser devices, optical fibers and so on N.A. measurement of optical fibers, optical waveguides and so on
WIDE AREA FFP MEASUREMENT SYSTEM	Wide area coverage type FFP measurement system that covers approx. 3mmφ light flux diameter to be measured.　Ideal for FFP and N.A. of large area light emitting devices and large core optical fibers, etc.	FFP measurement of large area light emitting elements such as array type light emitting elements N.A. measurement of large core optical fibers
【NEW】 EXTRA WIDE AREA FFP MEASUREMENT SYSTEM	Wide area coverage type FFP measurement system that covers approx. 4.24mmφ light flux diameter to be measured. Ideal for FFP and N.A. of large area light emitting devices and large core optical fibers, etc.	FFP measurement of large area light emitting elements such as array type light emitting elements N.A. measurement of large core optical fibers
HIGH RESOLUTION IR FFP MEASUREMENT SYSTEM	High resolution IR FFP measurement system for optical communication wavelength range of 1310~1550nm with angular pixel resolution of 0.1 °.	High resolution FFP measurement in IR wavelength range N.A. measurement of optical fibers, optical waveguides etc. in IR wavelength range Evaluation of Si-photonics devices
EF(Encircled Flux) / EAF(Encircled Angular Flux) MEASUREMENT SYSTEM	Rapid evaluation system for EF(Encircled Flux) and EAF(Encircled Angular Flux) analysis of multi-mode optical fibers by NFP/FFP measurement optics and image processing method.	Evaluation and analysis of Encircled Flux (EF) for GI-MMF, waveguide etc. Evaluation and analysis of Encircled Angular Flux (EAF) for SI-MMF, POF and waveguide etc.
COLLIMATED BEAM MEASUREMENT SYSTEM	High accuracy collimated beam measurement and analysis system by optics and image processing. Best for collimated beam evaluation, collimate lens alignment of various optical collimator devices and modules, etc.	Evaluation of collimated beam quality Alignment, assembling adjustment of various collimator modules
NFP/FFP SIMULTANEOUS MEASUREMENT SYSTEM	Simultaneous measurement of NFP&FFP by dedicated single optical unit. Possible to measure NFP and FFP, radiation angle, N.A. by single optical unit.	NFP/FFP evaluation of optical devices, optical fibers, optical waveguide modules and so on Alignment, assembling adjustment of various collimator modules
OPTICAL BEAM ANALYSIS MODULE AP013	Image processing and the data analysis system focusing on optical beam profile measurement and analysis, widely applicable to optical beam profile measurement application in combination with Synos’optical system, *M-Scope* series and detectors.	Laser beam profiler Optical beam profile and intensity analysis in general NFP/FFP/collimated beam analysis EF(Encircled Flux), EAF(Encircled Angular Flux) analysis

OPTICAL BEAM PROFILE MEASUREMENT SYSTEM FOR OUTPUT ~10W CLASS HIGH POWER LASER

HIGH POWER LASER NFP MEASUREMENT SYSTEM	Simplified type high power laser NFP measurement system for output ~10W class high power laser. Objective lens magnification is fixed (x10).	Beam profile measurement and analysis of output ~10W class high power laser devices and modules in application fields such as LiDAR, laser illumination, biometric authentication, sensing, electronics instruments
SOPHISTICATED OPTICAL BEAM NFP MEASUREMENT SYSTEM FOR HIGH POWER LASER	High functional NFP/beam profile measurement system for output ~10W class high power laser. Objective lens magnification is exchangeable by manual revolver.	NFP/Beam profile measurement and analysis of output ~10W class high power lasers and laser modules in application fields such as LiDAR, laser illumination, biometric authentication, sensing, electronics instruments
FFP MEASUREMENT SYSTEM FOR HIGH POWER LASER	FFP/N.A. measurement system for output ~10W class high power lasers. Covering about 3mmφ of light flux diameter to be measured.	FFP/N.A. measurement and analysis of output ~10W class high power lasers and laser modules in application fields such as LiDAR, laser illumination, biometric authentication, sensing, electronics instruments
FFP/NFP SIMULTANEOUS MEASUREMENT SYSTEM FOR HIGH POWER LASER	Simultaneous measurement system of NFP and FFP for output ~10W class blue high power lasers.	NFP/FFP simultaneous measurement and analysis of output ~10W class high power blue lasers and laser modules

APPLICATION-SPECIFIC OPTICAL MEASUREMENT AND INSPECTION SYSTEM

OPTICAL CONTINUITY TESTER FOR POLYMER WAVEGUIDE	High speed and high accuracy continuity test system for multi-channel polymer optical waveguide module. Optical continuity check system for compliant inspection for mass production.	High speed continuity test in mass production of polymer waveguides Core position, core pitch, core external shape measurement of polymer waveguides, etc.
OPTICAL CONTINUITY TESTER WITH SAMPLE LOADER/UNLORDER SYSTEM	A quick and accurate optical continuity tester for multi-channel polymer waveguide module for optical interconnection with automatic sample loader/unloader system.	High speed continuity test in mass production of polymer waveguide Core position, core pitch, core external shape measurement of polymer waveguide, etc.
OPTICAL METHOD INSERTION LOSS MEASUREMENT SYSTEM FOR POLYMER WAVEGUIDE	Insertion loss measurement system in combination with image observation and optical power alignment. Quick and easy insertion loss measurement can be realized in combination with SYNOS' M-Scope type M and manual/motorized stage system.	Manual/semi-automatic/automatic insertion loss measurement mainly for polymer optical waveguide modules
OPTICAL METHOD MICRO STRUCTURAL WAVEGUIDE INSERTION LOSS MEASUREMENT SYSTEM	Insertion loss measurement system, targeting on high resolutional measurement of ultra-fine structural waveguide modules such as Si-photonics waveguides, and so on. Quick and high precision insertion loss measurement can be realized in combination with SYNOS' *M-Scope type J* and motorized stage system.	Automatic and high precision insertion loss measurement targeting on ultra-fine structural waveguides such as Si-photonics waveguides, nearfield optical devices and so on.
WAFER LEVEL OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM FOR PHOTO DETECTOR	Wafer-level test of optical characteristic targeting on various light detecting devices such as Photo diode, sensing devices, in combination with SYNOS' optical measurement system and manual/semi-automatic prober systems.	Wafer level optical characteristic measurement for light receiving devices such as PD, optical sensors.
WAFER LEVEL OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM FOR VCSEL	Wafer-level test of optical characteristic mainly targeting on VCSEL and light emitting devices, in combination with SYNOS' optical measurement system and manual/semi-automatic prober systems.	Wafer level optical characteristic measurement for light emitting devices such as VCSELs, and so on.
FOCAL POSITION MEASUREMENT SYSTEM	Automatic measurement of the focal position and beam waist of micro lens, LD module and fiber module by special software.	Focal position measurement of micro lenses Focal position measurement of LD module with micro lenses Focal position measurement of lensed fiber modules

PHOTOMETRIC MODULE

	【NEW】 IVL MEASUREMENT MODULE PMD002/IVL	IVL Measurement Module PMD002/IVL is the photometric sensor module that can easily measure IVL characteristics of light emitting devices such as semiconductor lasers and VCSELs.	IVL characteristic measurement of laser diodes, laser devices, optical fibers, optical waveguides, and various optical devices and modules
	【NEW】 POLARIZATION MEASUREMENT MODULE PMD002/POL	Polarization Measurement Module PMD002/POL is the polarization and extinction ratio measurement module of the spatial polarizer rotation method.	Measurement of polarization and extinction ratio characteristic of laser diodes, laser devices, optical fibers, optical waveguides, and various optical devices and modules