光計測用光学機器と光計測システムのシナジーオプトシステムズ

PRODUCT OVERVIEW
OPTICAL BEAM FFP(FAR FIELD PATTERN) MEASUREMENT SYSTEM

Optical Beam FFP (Far Field Pattern) Measurement System is the FFP measurement and analysis system by optical method, widely applicable to FFP analysis of optical devices, optical modules such as laser diode, optical fiber, OPCB waveguide, etc.

Synos’ M-Scope type F, FFP Measurement Optics, is adopted in this system. In combination with M-Scope type F, image sensor and Synos' Optical Beam Analysis Module AP013, it is widely applicable for FFP, N.A. measurement and analysis of various optical devices, modules, components.

By selecting imaging detector, it will be applicable for optical beam profile observation and analysis from 400~1700nm wavelength range.

FEATURE

  • Synos’ M-Scope type F, FFP Measurement Optics, is adopted as FFP measurement optics
    • Realtime measurement and analysis of FFP by dedicated optics and image processing method
    • Long W.D. of approx. 6mm.
  • Possible to select suitable imaging detector from 400~1700nm wavelength range
    • for 400~1100nm : ISA071/ISA071GL, High Resolution CMOS Detector
    • for 950~1700nm : ISA041H2, InGaAs High Sensitivity NIR Detector
  • Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
    • All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
    • Optometrics BA Standard, specially designed high-functional software for optical beam profile analysis
      • Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
      • Furthermore, EF/EAF analysis function is installed as standard function.

APPLICATION

  • FFP measurement and analysis of various light emitted device such as laser, laser diode, etc.
  • FFP and N.A. measurement and analysis of various optical fibers
    • SMF, MMF, POF etc.
  • FFP and N.A. measurement and analysis of waveguide modules
    • Polymer waveguide for OPCB, Si photonics waveguide, etc.
    • Inclination measurement and analysis of 45° mirror installed in polymer waveguide for OPCB substrate.
  • Angular flux analysis of various MMF (multi-mode optical fiber)
  • Assembling adjustment between various optical module and micro lens module

SYSTEM COMPONENT SELECTION

SYSTEM COMPONENT SELECTION

MAIN COMPONENT

OPTION

  • Neutral density filter
    • About neutral density filter, please refer to here.
  • Optics base and workbench
    • Optics base unit for optical fiber measurement
    • About optics base and workbench, please refer to here.

RELATED PRODUCT INFORMATION

ADDITIONAL INFORMATION

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