OPTICAL MEASUREMENT SYSTEM SOLUTION
【NEW】EXTRA WIDE AREA FFP MEASUREMENT SYSTEM
PRODUCT OVERVIEW
EXTRA WIDE AREA FFP MEASUREMENT SYSTEM
This is the FFP(Far Field pattern) measurement system with a luminous flux diameter coverage of about φ4.24mm.
As the measurement optics, Synos' Extra Wide Area FFP Measurement Optics M-Scope type FSW is used. M-Scope type FSW is the optics for measuring FFP(Far-Field Pattern) with a luminous flux diameter coverage of about 4.24mmφ. By using this optics, it has become possible to cope with FFP measurement and emission N.A. measurements such as laser elements with large light emitting area, array type light emitting elements, and large core fibers.
In combination with detector and Optical Beam Analysis Module AP013, it can be used for FFP measurement and analysis of various optical devices with large light emitting area.
FEATURE
- Extra Wide Area FFP Measurement Optics M-Scope type FSW is adopted as measurement optics.
- Specially designed optics for realtime FFP(Far Field Pattern) observation and analysis
- Wide area type with measurement light flux diameter coverage of approx. 4.24mmφ
- Wide area type with measurement angle coverage of approx. ±45°
- Long working distance of approx.9mm
- 1" High Resolution CMOS Detector ISA061(designated) is adopted as the detector.
- Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
- All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
- Optometrics BA Standard, specially designed high-functional image processing software for optical beam profile analysis
- Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
- EF/EAF analysis function is installed as standard function.
APPLICATION
- FFP, N.A. measurement of large emission area laser element, array type laser element, etc.
- FFP, N.A. measurement of large core optical fiber
- FFP, N.A. measurement of various optical modules such as lens module, etc.
- Encircled Angular flux analysis of various SI-MMF
SYSTEM COMPONENT SELECTION
SYSTEM CONFIGURATION DIAGRAM
COMPONENT SELECTION
- Extra Wide Area FFP Measurement Optics M-Scope type FSW
- Target measurement wavelength : 850~940nm
- Please inquire separately about measurement wavelength support other than the above.
- Detector
- 400~1100nm：1" High Resolution CMOS Detector ISA061
- Optical Beam Analysis Module AP013
- Personal Computer for data processing
- Optical beam analysis software Optometrics BA Standard
- Calibration data set for NFP measurement
- Driver software for imaging detector
OPTIONAL UNITS・ACCESSORIES SELECTION
- Dedicated 60mmφ large size ND filter (designated)
- for NIR(850nm~940nm）：NDF NIR60
- Optics base and workbench
- Optics bench for optical fiber measurement
- Vertical type optics bench
- About optics base and workbench, please refer to here.
CATALOG DOWNLOAD
- In preparation