光計測用光学機器と光計測システムのシナジーオプトシステムズ

PRODUCT OVERVIEW
SIMPLIFIED OPTICAL MEASUREMENT OPTICS M-Scope type J

M-Scope type J is a compact and simplified optical system designed for multi-purpose optical measurement application such as optical irradiation, optical beam observation and image observation at the same time.

By combining the optical components according to the measurement purpose, it is easy to build an optical system best suited for the measurement purpose.

As M-Scope type J has small and simplified body structure, it is suitable for bulit-in use for various optical measurement system such as optical loss measurement system etc.

There are restrictions on functions and optical components that can be combined for M-Scope type J. Depending on the measurement purpose, it is encouraged to use it together with Sophisticated Optical Measurement Optics M-Scope Type I.

FEATURE

  • Optical fiber connect port is equipped. Available for various optical measurement in combination with various optical measurement system.
    • Optical beam irradiation measurement
      • Pinpoint irradiation of measurement beam onto the target sample precisely and easily
    • Light detection measurement
      • Pinpoint detection of measurement light from the target sample and relay to the optical fiber. Best for optical power measurement, wavelength measurement, etc.
  • Imaging port for optical sensor (camera) is equipped. Direct observation of irradiating beam position, light detecting position, etc. Furthermore, available as high functionality NFP/beam profile measurement optics.
    • In case of beam irradiation, it is possible to observe the beam irradiating position directly and easy to introduce measurement light on to the target.
    • In case of light detection, it is possible to observe the measurement light on the sample directly and easy to introduce measurement light to the optical fiber connected to the fiber port.
    • It is possible to apply for NFP/beam profile measurement.

APPLICATION

  • Optical beam irradiation measurement
    • Light sensitivity, response measurement of photo-diodes, photo-detectors, optical sensing devices, etc.
    • Measurement of insertion loss, propagation characteristics, and continuity due to light incident on various optical waveguides.
    • Failure analysis of semiconductor devices due to light incident on.
    • Bio technological application such as optical micro beam irradiation onto bio cells.
    • Measurement and analysis of optical characteristics of various minute samples by irradiation micro beam in general.
  • Optical beam detection measurement
    • Measurement of emission characteristics of laser device such as VCSEL, LD, laser module, etc.
    • Measurement of insertion loss, propagation characteristics, and continuity due to light detection on various optical waveguides.
    • Measurement of emission characteristics of light emitting devices in general.
  • Wafer-level optical characteristic measurement of various opto-semiconductor devices
  • Research and development of Silicon photonics devices.
  • Assembling adjustment, quality evaluation of various optical modules, lensed modules, etc.
  • General optical measurement and analysis.

SUMMARY OF SPECIFICATION

SUMMERY OF SPECIFICATION

Optical fiber connect port
  • Light irradiation:Irradiate the core diameter of connected fiber onto the target sample surface with 1:1 magnification (using 10x objective lens)
  • Light detection : Detect the light from the area of target sample surface equivalent to the core diameter of connected fiber with 1:1 magnification (using 10x objective lens)
Light irradiation/detection area (size)
  • Objective Lens 10x : equal to the core diameter of the connected fiber
  • Objective lens 20x : 1/2 size of the core diameter of the connected fiber
  • Objective lens 50x : 1/5 size of the core diameter of the connected fiber
Objective lens switching monocular (without manual revolver)
Objective lens Mitutoyo M-Plan Apo series (standard)
Intermediate lens for imaging port 1x (standard)
Total magnification for imaging port standard:100x (with 100x objective lens)
Coaxial epi-illumination port Port : φ8mm(external diameter) port for coaxial epi-illumination light unit
Option : Coaxial epi-illumination unit
Extinction method by Neutral Density Filter
Camera mount C mount

COMPONENT

COMPONENT SELECTION

STANDARD COMPONENT

  • Optics Main Part : 1set
    • Monocular type optics main unit (with optical fiber connect port, detector port, coaxial epi-illumination port) : 1
    • Optical fiber connect port (Irradiate and receive with a 1:1 optical fiber core diameter when using a 10x objective lens) : 1
    • imaging detector port (1x) : 1
    • Coaxial epi-illumination port (for outer diameter φ8mm lightguide) : 1
    • Manual revolver : none (monocular type)
  • Base plate for optics : 1set

OPTION

  • Variable Spot Size Converter Unit MS-OP012-VFPJ
    • Fiber port that can continuously change irradiation and receiving diameter. The continuous variable range is as follows.
      • Objective lens 10×: Irradiation/light reception with 1.11 to 3.33 times the equivalent diameter of the connected optical fiber core
      • Objective lens 20×: Irradiation/light reception with 0.55 to 1.66 times the equivalent diameter of the connected optical fiber core
      • Objective lens 50×: Irradiation/light reception with 0.22 to 0.66 times the equivalent diameter of the connected optical fiber core
  • Light Source Unit
    • About light source unit, please refer to here.
    • Various types of light source unit on the market is also available.
  • Objective lens selection
    • About objective lens selection, please refer to here.
  • Optical sensor selection
  • Neutral density filter
    • About neutral density filter, please refer to here.
  • Coaxial epi-illumination unit
    • About coaxial epi-illumination unit, please refer to here.
  • Optics base and workbench
    • Optics base unit for optical fiber measurement
    • Vertical workbench for optics
    • About optics base and workbench, please refer to here.

RELATED PRODUCT INFORMATION

POLARIZATION COMPENSATION TYPE SYMPLIFIED OPTICAL MEASUREMENT OPTICS M-Scope type J/PF

When the measurement is performed using a single-mode fiber for the introduction and irradiation of the measurement light, it may take stress on optical fiber under the external influence. In this case, it may change the polarization status in single-mode fiber, the stability of the measurement accuracy would be degraded in the entire measurement system. In case using half mirror(HM) in the optical system branching 2 or 3, when measuring the sample having such polarization characteristics, it may affect the measurement results due to polarization characteristics of HM.

M-Scope type J/PF is an optical system that achieves stable and high precision measurements even when the measurement sample has such polarization characteristics by removing the effects of polarization with special position of half mirror.

OPTICAL METHOD INSERTION LOSS AUTOMATIC MEASUREMENT SYSTEM FOR MICROSTRUCTURAL WAVEGUIDE DEVICE

This is optical method insertion loss measurement system targeting on micro structural waveguide device using Synos' Simplified Optical Measurement Optics M-Scope type J/PF.

It is possible to execute high speed and efficient insertion loss measurement of micro structural waveguide device such as silicon photonics waveguide device, near-field optical device and so on.

About this system in detail, please refer to here.

OUTSIDE DIMENSIONS

OUTSIDE DIMENSIONS <M-Scope type J>

*Outside dimensions above is reference values. These values change as equipped option and detector. Please ask the drawing data in details if necessary.

*Please ask us separately if you need the outside dimensions of M-Scope type J/PF.

TECHNICAL INFORMATION

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