OPTICAL MEASUREMENT SYSTEM SOLUTION
INSERTION LOSS MEASUREMENT SYSTEM FOR MICROSTRUCTURAL WAVEGUIDE
PRODUCT OVERVIEW
OPTICAL METHOD INSSERTION LOSS AUTOMATIC MEASUREMENT SYSTEM FOR MICROSTRUCTURAL WAVEGUIDE DEVICE
This is optical method automatic insertion loss measurement system targeting on micro structural waveguide device using Synos' Optical Measurement Optics M-Scope type J/PF. It is possible to execute high speed and efficient insertion loss measurement of micro structural waveguide device such as silicon photonics waveguide device, single-mode optical device and so on.
The coaxial observation imaging detector enables direct image observation of the entrance and exit side core end faces of the measured optical waveguide. This makes it possible to position the incident and received positions of measurement light by image processing analysis.
By combining high precision motorized stage system, coarse alignment by image processing, and power alignment by automatic alignment software, the insertion loss of the microstructural waveguide can be measured efficiently at high speed and with high reproducibility.
FEATURE
- Optical method insertion loss measurement using Synos' Simplified Optical Measurement Optics M-Scope typeJ/PF
- M-Scope type J/PF is for micro beam irradiation and detection measurement optical system equipped with coaxial observation camera, so that it enables the position adjustment of incident and detection light by observing the sample image directly.
- Polarization-free type optical fiber connect port is adopted, and reduced the influence of polarization in measurement.
- Possible to select objective lens
- Maximum optical magnification for observation is 100x, applicable to observe edge of micro structural waveguide chip such as Si photonics waveguide device, single mode optical waveguide device etc.
- It irradiates the core diameter edge onto sample surface with 1:1 magnification and detects the light from sample surface. Any optical fibers with different core diameters can be used as having conjugation conditions with optical fiber alignment.
- It can make optical power measurement by optical fiber as well as wavelength measurement used with optical spectrum analyzer.
- Dedicated image processing and automatic alignment software is prepared. In combination with various high precision motorized stage system, it is possible to built up high speed and high accuracy automatic loss measurement system, applicable to mass production test.
APPLICATION
- Insertion loss measurement for microstructural waveguide device such as Silicon photonics device, etc.
- Observation of output light and output edge condition of Silicon photonics device, near-field optical device, etc.
- Analysis of optical transmission characteristics of Silicon photonics device, near-field optical device, etc.
SYSTEM COMPONENT SELECTION
SYSTEM CONFIGURATION DIAGRAM
COMPONENT SELECTION
- Input side/output side optics selection
- Simplified Optical Measurement Optics M-Scope type J/PF (polarization free model)
- Detector selection
- for 400~1100nm : High Resolution CMOS Detector ISA071/ISA071GL
- for 950~1700nm : InGaAs High Sensitivity NIR Detector ISA041H2
- for 400~1700nm : InGaAs High Resolution NIR Detector ISA041HRA/ISA041HRVA
- About optical sensor selection, please refer to here.
- Position stage selection
- High precision motorized positioning stage system
- Selectable per number of axis, operating range, mechanical size and others. Please contact us for stage configuration and selection.
- Motorized stage control system
- System base, system platform
- Base plate, system platform, bracket, etc.
- Accessories, peripherals
- System control and data analysis system (PC, peripherals, System control and data analysis software, I/F hardware, etc.)
- Sample holder (fixture)
- Safety equipment etc.
- Configuration written above is a standard example, and we can deliver any configuration according to the applications.
OPTIONAL UNITS・ACCESSORIES SELECTION
- Objective lens selection
- About objective lens selection, please refer to here.
- ND filter
- for visible（400~700nm）：NDF-5
- for NIR（700nm~1100nm）：NDF NIR-5
- for IR（1310nm~1550nm）：NDF IR-5
- About ND filter, please refer to here.
- Measurement Light Source
- LD light source
- SLD light source
- ASE light source etc.
- About light source, please refer to here.
- Measurement instruments
- Optical powermeter
- Optical Spectrum analyzer, etc.
- Coaxial epi-illumination system
- About coaxial epi-illumination system, refer to here.
- Anti-vibration table, shield box, system rack, etc.